Anharmonicity, solvation forces, and resolution in atomic force microscopy at the solid-liquid interface

A study of interaction forces at the solid-liquid interface using Atomic Force Microscopy

Anharmonicity in multifrequency atomic force microscopy

In multifrequency atomic force microscopy higher eigenmodes are externally excited to enhance resolution and contrast while simultaneously increasing the number of experimental observables with the use of gentle forces. Here, the implications of externally exciting multiple frequencies are discussed in terms of cantilever anharmonicity, fundamental period and the onset of subharmonic and superh...

Forces and frequency shifts in atomic-resolution dynamic-force microscopy

True atomic resolution in vacuum with a force microscope is now obtained routinely by using the frequency shift of an oscillating cantilever as the imaging signal. Here, a calculation is presented that relates the frequency shift to the forces between tip and sample for both large and small oscillation amplitudes. Also, the frequency versus distance data for van der Waals dominated tip-sample i...

Probing charge screening dynamics and electrochemical processes at the solid-liquid interface with electrochemical force microscopy.

The presence of mobile ions complicates the implementation of voltage-modulated scanning probe microscopy techniques such as Kelvin probe force microscopy (KPFM). Overcoming this technical hurdle, however, provides a unique opportunity to probe ion dynamics and electrochemical processes in liquid environments and the possibility to unravel the underlying mechanisms behind important processes at...

Nonlinear dynamics of the atomic force microscope at the liquid-solid interface